Detail publikace

Characterization of 3D-knitted Substrates

LÁČÍK, J. RAIDA, Z. DŘÍNOVSKÝ, J. CUPAL, M. KRÁČALOVÁ, D. PROCHÁZKA, J. LÉDROVÁ, Z.

Originální název

Characterization of 3D-knitted Substrates

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with the relative permittivity measurement of the selected types of 3D-knitted fabrics by the two-line method combined with the matrix-pencil method and by the transmission/reflection method. The measured relative permittivity of the fabrics is in the range from 1.17 to 1.23. Further, the fabrics exhibit slight anisotropic behavior. The obtained results can be used for the design of the microwave devices where the 3D knitted fabrics play the role of the substrate.

Klíčová slova

Three-dimensional knitted fabric, dielectric constant measurement, textile-integrated electronics, vehicular applications

Autoři

LÁČÍK, J.; RAIDA, Z.; DŘÍNOVSKÝ, J.; CUPAL, M.; KRÁČALOVÁ, D.; PROCHÁZKA, J.; LÉDROVÁ, Z.

Vydáno

5. 10. 2020

Nakladatel

IEEE

Místo

Varšava, Polsko

ISBN

978-83-949421-7-5

Kniha

Proceedings of MIKON 2020

Strany od

241

Strany do

243

Strany počet

3

URL

https://ieeexplore.ieee.org/document/9253876

BibTex

@inproceedings{BUT165860,
  author="Jaroslav {Láčík} and Zbyněk {Raida} and Jiří {Dřínovský} and Miroslav {Cupal} and Dita {Kráčalová} and Jiří {Procházka} and Zdeňka {Lédrová}",
  title="Characterization of 3D-knitted Substrates",
  booktitle="Proceedings of MIKON 2020",
  year="2020",
  pages="241--243",
  publisher="IEEE",
  address="Varšava, Polsko",
  doi="10.23919/MIKON48703.2020.9253876",
  isbn="978-83-949421-7-5",
  url="https://ieeexplore.ieee.org/document/9253876"
}