Detail publikace

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Nagy, Z., Kohoutek, M.

Originální název

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with diffraction pattern analysis for accurate 2d non-contact dimensional measurements.

Klíčová slova v angličtině

diffraction of light, subpixel analysis, dimensional measurement

Autoři

Nagy, Z., Kohoutek, M.

Rok RIV

2005

Vydáno

1. 1. 2005

Nakladatel

VIIP 2005

Místo

Benidorm

Strany od

1

Strany do

6

Strany počet

6

BibTex

@inproceedings{BUT16656,
  author="Zoltán {Nagy} and Michal {Kohoutek}",
  title="DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS",
  booktitle="Proceedins of the Int. Conf. Visualisation, Imaging and Image Processing 2005",
  year="2005",
  series="edice",
  volume="rocnik",
  number="poradi",
  pages="6",
  publisher="VIIP 2005",
  address="Benidorm"
}