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BOSIO, A. DI CARLO, S. GIRARD, P. SANCHEZ, E. SAVINO, A. SEKANINA, L. TRAIOLA, M. VAŠÍČEK, Z. VIRAZEL, A.
Originální název
Design, Verification, Test and In-Field Implications of Approximate Computing Systems
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Today, the concept of approximation in computing is becoming more and more a "hot topic" to investigate how computing systems can be more energy efficient, faster, and less complex. Intuitively, instead of performing exact computations and, consequently, requiring a high amount of resources, Approximate Computing aims at selectively relaxing the specifications, trading accuracy off for efficiency. While Approximate Computing gives several promises when looking at systems' performance, energy efficiency and complexity, it poses significant challenges regarding the design, the verification, the test and the in-field reliability of Approximate Computing systems. This tutorial paper covers these aspects leveraging the experience of the authors in the field to present state-of-the-art solutions to apply during the different development phases of an Approximate Computing system.
Klíčová slova
approximate computing, circuit, design, test
Autoři
BOSIO, A.; DI CARLO, S.; GIRARD, P.; SANCHEZ, E.; SAVINO, A.; SEKANINA, L.; TRAIOLA, M.; VAŠÍČEK, Z.; VIRAZEL, A.
Vydáno
6. 7. 2020
Nakladatel
Institute of Electrical and Electronics Engineers
Místo
Los Alamitos
ISBN
978-1-7281-4312-5
Kniha
25th IEEE European Test Symposium
Strany od
1
Strany do
10
Strany počet
URL
https://ieeexplore.ieee.org/document/9131557
BibTex
@inproceedings{BUT168125, author="BOSIO, A. and DI CARLO, S. and GIRARD, P. and SANCHEZ, E. and SAVINO, A. and SEKANINA, L. and TRAIOLA, M. and VAŠÍČEK, Z. and VIRAZEL, A.", title="Design, Verification, Test and In-Field Implications of Approximate Computing Systems", booktitle="25th IEEE European Test Symposium", year="2020", pages="1--10", publisher="Institute of Electrical and Electronics Engineers", address="Los Alamitos", doi="10.1109/ETS48528.2020.9131557", isbn="978-1-7281-4312-5", url="https://ieeexplore.ieee.org/document/9131557" }