Detail publikace

Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN, O. KOTÁSEK, Z.

Originální název

Random Test Generation Through a Probabilistic Constrained Grammar

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper introduces a probabilistic constrained grammar which is a  newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.

Autoři

ČEKAN, O.; KOTÁSEK, Z.

Vydáno

25. 4. 2018

Místo

Budapešť

Strany od

5

Strany do

8

Strany počet

4

BibTex

@inproceedings{BUT168460,
  author="Ondřej {Čekan} and Zdeněk {Kotásek}",
  title="Random Test Generation Through a Probabilistic Constrained Grammar",
  booktitle="INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2018",
  pages="5--8",
  address="Budapešť"
}