Detail publikace

Local near-field scanning optical microscopy and spectroscopy of nanostructures

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P.

Originální název

Local near-field scanning optical microscopy and spectroscopy of nanostructures

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Visible and near infrared Scanning Near Field Optical Microscopy (SNOM) was used to characterize nanostructured semiconductor materials and structures. SNOM is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation. The fiber probe is scanned over the sample while being held ~10 nm above the surface. At this point, any number of high resolution (~100 nm) optical measurements can be made. In this work, the SNOM-induced photocurrent in GaAs devices was measured.

Klíčová slova

nanostructures, near-field spectroscopy, local optical properties, local photolumine-scence, locally induced photocurrent

Autoři

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., BRÜSTLOVÁ, J., DOBIS, P.

Rok RIV

2005

Vydáno

10. 2. 2005

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

80-214-2793-0

Kniha

Nano´04

Strany od

188

Strany do

193

Strany počet

6

BibTex

@inproceedings{BUT17006,
  author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Jitka {Brüstlová} and Pavel {Dobis}",
  title="Local near-field scanning optical microscopy and spectroscopy of nanostructures",
  booktitle="Nano´04",
  year="2005",
  pages="188--193",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-214-2793-0"
}