Detail publikace

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

GUEN, E. KLAPETEK, P. PUTTOCK, R. HAY, B. ALLARD, A. MAXWELL, T. CHAPUIS, P.O. RENAHY, D. DAVEE, G. VALTR, M. MARTINEK, J. KAZAKOVA, O. GOMES, S.

Originální název

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA).

Klíčová slova

Scanning Thermal Microscopy; thermomechanical analysis; uncertainty

Autoři

GUEN, E.; KLAPETEK, P.; PUTTOCK, R.; HAY, B.; ALLARD, A.; MAXWELL, T.; CHAPUIS, P.O.; RENAHY, D.; DAVEE, G.; VALTR, M.; MARTINEK, J.; KAZAKOVA, O.; GOMES, S.

Vydáno

30. 5. 2020

Nakladatel

Elsevier

Místo

Amsterdam, NL

ISSN

1290-0729

Periodikum

INTERNATIONAL JOURNAL OF THERMAL SCIENCES

Ročník

156

Číslo

106502

Stát

Francouzská republika

Strany od

1

Strany do

9

Strany počet

9

URL

https://www.scopus.com/record/display.uri?eid=2-s2.0-85085270541&origin=resultslist

BibTex

@article{BUT170099,
  author="GUEN, E. and KLAPETEK, P. and PUTTOCK, R. and HAY, B. and ALLARD, A. and MAXWELL, T. and CHAPUIS, P.O. and RENAHY, D. and DAVEE, G. and VALTR, M. and MARTINEK, J. and KAZAKOVA, O. and GOMES, S.",
  title="SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis",
  journal="INTERNATIONAL JOURNAL OF THERMAL SCIENCES",
  year="2020",
  volume="156",
  number="106502",
  pages="1--9",
  doi="10.1016/j.ijthermalsci.2020.106502",
  issn="1290-0729",
  url="https://www.scopus.com/record/display.uri?eid=2-s2.0-85085270541&origin=resultslist"
}