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DALLAEV, R.
Originální název
Characterization of AlN nanolayers deposited on a surface of HOPG by PE-ALD
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
In this study plasma-enhanced atomic layer deposition process of AlN has been performed with the purpose to test the expediency of highly oriented pyrolytic graphite (HOPG) to serve as a substrate in such process. The obtained samples were thoroughly analyzed using various analytical techniques. Atomic force microscopy was employed for studying topographic and morphological features of the surface; x-ray photoelectron spectroscopy (XPS) analysis supported by second ion-mass spectrometry method (SIMS) has been conducted on the obtained sample to investigate the chemical nature of the deposited films as well as elemental distribution. Temperature stability of HOPG makes it a suitable substrate for preparation of AlN films, being a bottom contact for further testing of the films electrical properties. The data gathered from the aforementioned techniques have indicated that HOPG is a viable choice for AlN ALD process.
Klíčová slova
aluminium nitride, atomic layer deposition, highly oriented pyrolytic graphite, x-ray photoelectron spectroscopy, atomic force microscopy, second ion-mass spectrometry.
Autoři
Vydáno
10. 6. 2021
Nakladatel
Brno University of Technology, Faculty of Electrical Engineering and Communication
Místo
Brno
ISBN
978-80-214-5943-4
Kniha
Proceedings of the 27th Conference STUDENT EEICT 2021 selected papers
Edice
1
Strany od
193
Strany do
198
Strany počet
6
URL
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2021_sbornik_2_v3_DOI.pdf
BibTex
@inproceedings{BUT171782, author="Rashid {Dallaev}", title="Characterization of AlN nanolayers deposited on a surface of HOPG by PE-ALD", booktitle="Proceedings of the 27th Conference STUDENT EEICT 2021 selected papers", year="2021", series="1", pages="193--198", publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication", address="Brno", doi="10.13164/eeict.2021.193", isbn="978-80-214-5943-4", url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2021_sbornik_2_v3_DOI.pdf" }