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BRODSKÝ, J. GABLECH, I.
Originální název
Wet etching of SiO2 as sacrificial layer with infinite selectivity to Al
Anglický název
Typ
článek ve sborníku mimo WoS a Scopus
Jazyk
čeština
Originální abstrakt
This work presents an unusual method for releasing microelectromechanical systems which contain an Al layer. This is done by wet etching of SiO2 as a sacrificial layer. Mixture of 49% HF acid and 20% H2SO4∙SO3 (oleum) is used. Oleum keeps the solution water-free and subsequently prevents the attack of Al layer. Exceptional etch rate (≈ 1 µm·min−1) of thermally grown SiO2 is achieved by this method. The infinite selectivity to Al layer is verified by measuring the thickness of layer before and after etching. The etching itself is done in an ordinary fume hood in polytetrafluorethylene (PTFE) beaker.
Anglický abstrakt
Klíčová slova
MEMS, selectivity, SiO2 etching, sacrificial layer
Klíčová slova v angličtině
Autoři
BRODSKÝ, J.; GABLECH, I.
Vydáno
27. 4. 2020
Nakladatel
VUT
Místo
Brno, Czech Republic
ISBN
978-80-214-5867-3
Kniha
Proceedings of the 26th Conference STUDENT EEICT
Strany od
292
Strany do
295
Strany počet
4
BibTex
@inproceedings{BUT171864, author="Jan {Brodský} and Imrich {Gablech}", title="Wet etching of SiO2 as sacrificial layer with infinite selectivity to Al", booktitle="Proceedings of the 26th Conference STUDENT EEICT", year="2020", pages="292--295", publisher="VUT", address="Brno, Czech Republic", isbn="978-80-214-5867-3" }