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ALLAHAM, M. BURDA, D. MOUSA, M. KNÁPEK, A. AlJrawen S.Y. AlSa’eed M. H.
Originální název
Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Field electron emission theory and experiments include testing and analyzing the measured current-voltage characteristics using the so-called Fowler-Nordheim or Murphy-Good plots. Although Fowler-Nordheim plots are theoretically predicted to be slightly curved and Murphy-Good plots are predicted to be almost-exactly straight, still they provide the same results when applying the field-emission orthodoxy test to practical experimental data, and near results when extracting the emitter characterization parameters. This study is to compare the analysis results that will be obtained when applying the two methods to experimental data obtained from Molybdenum single field emitters, mounted in a traditional field emission microscope, and operated in high vacuum conditions (~10 -6 Pa).
Klíčová slova
Geometry; Shape; Surface contamination; Ions; Iron; Electron emission; Molybdenum
Autoři
ALLAHAM, M.; BURDA, D.; MOUSA, M.; KNÁPEK, A.; AlJrawen S.Y.; AlSa’eed M. H.
Vydáno
17. 11. 2021
Nakladatel
2021 34th International Vacuum Nanoelectronics Conference (IVNC)
Místo
Lyon, France
ISBN
978-1-6654-2589-6
Kniha
ISSN
2380-6311
Periodikum
Stát
Spojené státy americké
Strany od
151
Strany do
152
Strany počet
2
URL
https://ieeexplore.ieee.org/document/9600771
BibTex
@inproceedings{BUT175014, author="Mohammad Mahmoud {Allaham} and Marwan {Mousa} and Daniel {Burda} and Mohammad H. {AlSa'eed} and Sabreen Y. {AlJrawen} and Alexandr {Knápek}", title="Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots", booktitle="2021 34th International Vacuum Nanoelectronics Conference (IVNC)", year="2021", journal="2021 34th International Vacuum Nanoelectronics Conference (IVNC)", pages="151--152", publisher="2021 34th International Vacuum Nanoelectronics Conference (IVNC)", address="Lyon, France", doi="10.1109/IVNC52431.2021.9600771", isbn="978-1-6654-2589-6", issn="2380-6311", url="https://ieeexplore.ieee.org/document/9600771" }