Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope

článek v časopise ve Web of Science, Jimp

angličtina

For most materials science oriented applications incoherent cathodoluminescence (CL) is of main interest, for which the recombination of electron-hole pairs yields the emission of light. However, the incoherent signal is superimposed by coherently excited photons, similar to the situation for X-rays in Energy-Dispersive X-ray spectra (EDX). In EDX two very different processes superimpose in each spectrum: Bremsstrahlung and characteristic X-ray radiation. Both processes yield X-rays, however, their origin is substantially different. Therefore, in the present CL study we focus on the coherent emission of light, in particular Cerenkov radiation. We use a 200 mu m thick GaAs sample, not electron transparent and therefore not acting as a light guide, and investigate the radiation emitted from the top surface of the sample generated by back-scattered electrons on their way out of the specimen. The CL spectra revealed a pronounced peak corresponding to the expected interband transition. This peak was at 892 nm at room temperature and shifted to 845 nm at 80 K. The coherent light emission significantly modifies the shape of CL spectra at elevated beam energies. For the first time, by the systematic variation of current and energy of primary electrons we could distinguish the coherent and incoherent light superimposed in CL spectra. These findings are essential for the correct interpretation of CL spectra in STEM. The Cerenkov intensity as well as the total intensity in a spectrum scales linearly with the beam current. Additionally, we investigate the influence of asymmetric mirrors on the spectral shapes, collecting roughly only half of the whole solid angle. Different emission behaviour of different physical causes thus lead to changes in the overall spectral shape.

Cathodoluminescence; Cerenkov radiation; Transition radiation

Stoger-Pollach, M.; Pichler, CF.; Dan, T.; Zickler, GA.; Bukvisova, K.; Eibl, O.; Brandstatter, F.

1. 5. 2021

ELSEVIER

AMSTERDAM

1879-2723

ULTRAMICROSCOPY

224

1

Nizozemsko

113260-1

113260-6

6

https://www.sciencedirect.com/science/article/pii/S0304399121000516?via%3Dihub