Detail publikace

An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference

KROLÁK, D. HORSKÝ, P.

Originální název

An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This article presents a new electromagnetic compatibility improved bandgap voltage reference with a low-current consumption of only 3.2 μA. The reference is designed for automotive applications with an extended temperature range from −50 to 200 °C and a low electromagnetic interference (EMI) susceptibility. The designed reference comes from the well-known Brokaw bandgap topology utilizing only five bipolar junction transistors in a reference core with a collector current leakage compensation. We propose several novel EMI susceptibility improvements of the reference core with a new asymmetrical operational amplifier. Every improvement is discussed in detail and general recommendations, on how to decrease the bandgap EMI susceptibility, are presented. Simulation results are compared with measurements on a system on chip. Measurement results show dc voltage variation below 0.5% for 5 mW (7 dBm) supply EMI over the frequency range from 100 kHz to 1 GHz.

Klíčová slova

Bandgap voltage reference, Brokaw bandgap voltage reference, bandgap reference, electromagnetic compatibility, electromagnetic interference, integrated circuit, voltage reference

Autoři

KROLÁK, D.; HORSKÝ, P.

Vydáno

16. 4. 2024

Nakladatel

IEEE

Místo

Piscataway, USA

ISSN

1558-187X

Periodikum

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY

Ročník

1

Číslo

1

Stát

Spojené státy americké

Strany od

1

Strany do

8

Strany počet

8

URL

https://ieeexplore.ieee.org/document/10502225

BibTex

@article{BUT177757,
  author="David {Krolák} and Pavel {Horský}",
  title="An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference",
  journal="IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY",
  year="2024",
  volume="1",
  number="1",
  pages="1--8",
  doi="10.1109/TEMC.2024.3381816",
  issn="1558-187X",
  url="https://ieeexplore.ieee.org/document/10502225"
}