Detail publikace

On the Efficiency and Security of Quantum-resistant Key Establishment Mechanisms on FPGA Platforms

MALINA, L. RICCI, S. DOBIÁŠ, P. JEDLIČKA, P. HAJNÝ, J. CHOO, K.

Originální název

On the Efficiency and Security of Quantum-resistant Key Establishment Mechanisms on FPGA Platforms

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The importance of designing efficient and secure post-quantum cryptographic algorithms is reinforced in the recent National Institute of Standards and Technology (NIST)’s Post-Quantum Cryptography (PQC) competitions. Seeking to complement existing studies that evaluate the performance of various PQC algorithms, we explore current hardware implementations of third-round finalist key-establishment algorithms (i.e., Kyber, McEliece, NTRU, and SABER) and the five alternate algorithms (i.e., BIKE, FrodoKEM, HQC, NTRU Prime, and SIKE) on Field Programmable Gate Array (FPGA) platforms. Further, we present our pure-VHDL implementation of Kyber and compare it with the hardware implementations of the NIST finalists. Our design offers one universal Kyber component that can operate in 6 different modes. The evaluation findings show that our pure-VHDL Kyber provides less latency than current VHDL-based implementations.

Klíčová slova

FPGA; Hardware Implementation; Key Establishment; Post-quantum Cryptography; Security; VHDL

Autoři

MALINA, L.; RICCI, S.; DOBIÁŠ, P.; JEDLIČKA, P.; HAJNÝ, J.; CHOO, K.

Vydáno

11. 7. 2022

ISBN

978-989-758-590-6

Kniha

19th International Conference on Security and Cryptography (SECRYPT 2022)

Strany od

605

Strany do

613

Strany počet

9

BibTex

@inproceedings{BUT178575,
  author="Lukáš {Malina} and Sara {Ricci} and Patrik {Dobiáš} and Petr {Jedlička} and Jan {Hajný} and Kim-Kwang Raymond {Choo}",
  title="On the Efficiency and Security of Quantum-resistant Key Establishment Mechanisms on FPGA Platforms",
  booktitle="19th International Conference on Security and Cryptography (SECRYPT 2022)",
  year="2022",
  pages="605--613",
  doi="10.5220/0011294200003283",
  isbn="978-989-758-590-6"
}