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KHATEB, F. KULEJ, T. AKBARI, M. KEA-TIONG, T.
Originální název
A 0.5-V Multiple-Input Bulk-Driven OTA in 0.18-mu m CMOS
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
This article presents the experimental results for a multiple-input operational transconductance amplifier (MI-OTA). To achieve extended linearity under 0.5-V low voltage supply, the circuit employs three linearization techniques: the bulk-driven (BD), the source degeneration, and the input voltage attenuation created by the MI metal-oxide-semiconductor transistor technique (MI-MOST). Although the linearization techniques result in reduced dc gain, the self-cascode transistors are used to boost the gain of the MI-OTA. Furthermore, the MI-MOST simplifies the internal structure of the OTA and may reduce the complexity of the applications. The MI-OTA operates in the subthreshold region and offers tunability by a bias current in the nanoampere range. The circuit is capable to work with 0.5-V supply voltage while consuming 24.77 nW. The circuit was fabricated using the 0.18- mu m Taiwan Semiconductor Manufacturing Company (TSMC) CMOS technology and it occupies a 0.01153-mm(2) silicon area. Intensive simulation and experimental results confirm the benefits and robustness of the design.
Klíčová slova
Bulk-driven (BD) amplifier; linear operational transconductance amplifier (OTA); low power; low voltage; transconductance amplifier
Autoři
KHATEB, F.; KULEJ, T.; AKBARI, M.; KEA-TIONG, T.
Vydáno
7. 10. 2022
Nakladatel
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Místo
PISCATAWAY
ISSN
1063-8210
Periodikum
IEEE Trans. on VLSI Systems.
Ročník
30
Číslo
11
Stát
Spojené státy americké
Strany od
1739
Strany do
1747
Strany počet
9
URL
https://ieeexplore.ieee.org/document/9894730
BibTex
@article{BUT179454, author="Fabian {Khateb} and Tomasz {Kulej} and Meysam {Akbari} and Tang {Kea-Tiong}", title="A 0.5-V Multiple-Input Bulk-Driven OTA in 0.18-mu m CMOS", journal="IEEE Trans. on VLSI Systems.", year="2022", volume="30", number="11", pages="1739--1747", doi="10.1109/TVLSI.2022.3203148", issn="1063-8210", url="https://ieeexplore.ieee.org/document/9894730" }