Detail publikace

On the possibility of the utilizing polynomial chaos expansion for reliability-oriented sensitivity analysis

NOVÁK, L. KALA, Z. NOVÁK, D.

Originální název

On the possibility of the utilizing polynomial chaos expansion for reliability-oriented sensitivity analysis

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper is focused on fast and efficient method of estimation of reliability-oriented sensitivity indices using Polynomial Chaos Expansion (PCE). It is shown that once the approximation of limit state function is created, it is possible to obtain condi-tional failure probabilities and sensitivity indices directly from PCE without any additional computational demands. The proposed approach is applied on fundamental numerical example with known reference solution and its efficiency and accuracy is discussed. Two reliability-oriented sensitivity indices directly oriented to the failure probability are estimated and compared. The comparison is performed on a interval of failure probability from zero to one. PCE has proven to be an effective tool for estimating sensitivity indices, especially for low probabilities of failure.

Klíčová slova

Polynomial Chaos Expansion, Sensitivity Analysis, Reliability

Autoři

NOVÁK, L.; KALA, Z.; NOVÁK, D.

Vydáno

6. 4. 2022

Nakladatel

American Institute of Physics Inc.

Místo

New York, USA

ISBN

978-0-7354-4182-8

Kniha

AIP Conference Proceedings

Číslo edice

2425

ISSN

0094-243X

Periodikum

AIP conference proceedings

Stát

Spojené státy americké

Strany od

1

Strany do

4

Strany počet

4

BibTex

@inproceedings{BUT180248,
  author="Lukáš {Novák} and Zdeněk {Kala} and Drahomír {Novák}",
  title="On the possibility of the utilizing polynomial chaos expansion for reliability-oriented sensitivity analysis",
  booktitle="AIP Conference Proceedings",
  year="2022",
  journal="AIP conference proceedings",
  number="2425",
  pages="4",
  publisher="American Institute of Physics Inc.",
  address="New York, USA",
  doi="10.1063/5.0081542",
  isbn="978-0-7354-4182-8",
  issn="0094-243X"
}