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MISIUREV, D. HOLCMAN, V
Originální název
Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films
Typ
článek ve sborníku mimo WoS a Scopus
Jazyk
angličtina
Originální abstrakt
The paper will provide a brief overview of one of the most popular multiferroic material bismuth ferrite, which was under intense study over the past decades. The reasons why the material earned such a great popularity in recent years will be described in detail. Piezoresponse Force Microscopy (PFM) would be used in order to investigate ferroelectric and magnetic properties of the material. In addition to ferroelectric and magnetic properties, the PFM method reveals the presence of piezo–active regions with different orientation based on their colorations. Samples of 100 nm BiFeO3 material were deposited by using pulsed laser deposition technique on multiplayer substrates Pt/Ti(TiO2)/Si will undergo investigation by PFM. The investigation of produced samples is necessary to determine the topology of produce samples in terms of surface roughness across the investigated surface and potential effect of topology of deposited samples on layout of domains.
Klíčová slova
Nanomaterials, multiferroics, ferroelectrics, bismuth ferrite, piezoresponce, polarization.
Autoři
MISIUREV, D.; HOLCMAN, V;
Vydáno
1. 7. 2023
Strany od
410
Strany do
414
Strany počet
5
URL
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf
BibTex
@inproceedings{BUT183667, author="Denis {Misiurev} and Vladimír {Holcman}", title="Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films", year="2023", pages="410--414", url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf" }