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Detail publikace
DENIZIAK, S. SITEK, P. JENIHHIN, M. STEININGER, A. SCHÖLZEL, M. MRÁZEK, V.
Originální název
27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Typ
konferenční sborník (ne článek)
Jazyk
angličtina
Originální abstrakt
This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.
Klíčová slova
electronic circuit, design, test, design method, digital circuit, analog circuit
Autoři
DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V.
Vydáno
14. 5. 2024
Nakladatel
Institute of Electrical and Electronics Engineers
Místo
Kliece
ISBN
979-8-3503-5934-3
Strany počet
155
URL
https://ieeexplore.ieee.org/servlet/opac?punumber=10508803
BibTex
@proceedings{BUT188622, editor="DENIZIAK, S. and SITEK, P. and JENIHHIN, M. and STEININGER, A. and SCHÖLZEL, M. and MRÁZEK, V.", title="27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems", year="2024", pages="155", publisher="Institute of Electrical and Electronics Engineers", address="Kliece", doi="10.1109/DDECS60919.2024", isbn="979-8-3503-5934-3", url="https://ieeexplore.ieee.org/servlet/opac?punumber=10508803" }