Detail publikace

RT Level Testability Analysis to Reduce Test Application Time

KOTÁSEK, Z. ZBOŘIL, F.

Originální název

RT Level Testability Analysis to Reduce Test Application Time

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper describes the research activities the goal of which is to develop a methodology that solves the problem of the RT level testability analysis in a complex way. On the basis of the RT level testability analysis the reduction in test application time can be achieved. A new model of RT level elements classification for the purposes of the RT level testability analysis is described. The prescription for an RTL circuit transformation to a labelled directed graph and its representation in PROLOG environment are presented. The methodology for the RT level testability analysis and the principles of its implementation are described.

Klíčová slova

RT Level Testability Analysis, Element Classification, PROLOG

Autoři

KOTÁSEK, Z.; ZBOŘIL, F.

Vydáno

1. 1. 1997

Nakladatel

unknown

Místo

Budapest

ISBN

0-8186-8129-2

Kniha

Proceedings of the EUROMICRO 97

Strany od

104

Strany do

111

Strany počet

8

BibTex

@inproceedings{BUT191445,
  author="Zdeněk {Kotásek} and František {Zbořil}",
  title="RT Level Testability Analysis to Reduce Test Application Time",
  booktitle="Proceedings of the EUROMICRO 97",
  year="1997",
  pages="104--111",
  publisher="unknown",
  address="Budapest",
  isbn="0-8186-8129-2"
}