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KLAPETEK, P. NEČAS, D. HEAPS, E. SAUVET, B. KLAPETEK, V. VALTR, M. KORPELAINEN, V. YACOOT, A.
Originální název
Stitching accuracy in large area scanning probe microscopy
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Image stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.
Klíčová slova
SPM; stitching; uncertainty; data processing
Autoři
KLAPETEK, P.; NEČAS, D.; HEAPS, E.; SAUVET, B.; KLAPETEK, V.; VALTR, M.; KORPELAINEN, V.; YACOOT, A.
Vydáno
4. 10. 2024
Nakladatel
IOP Publishing Ltd
Místo
BRISTOL
ISSN
1361-6501
Periodikum
Measurement Science and Technology
Ročník
35
Číslo
12
Stát
Spojené království Velké Británie a Severního Irska
Strany od
125026
Strany do
125037
Strany počet
URL
https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13
BibTex
@article{BUT193388, author="Petr {Klapetek} and David {Nečas} and Edward {Heaps} and Bruno {Sauvet} and Vojtěch {Klapetek} and Miroslav {Valtr} and Virpi {Korpelainen} and Andrew {Yacoot}", title="Stitching accuracy in large area scanning probe microscopy", journal="Measurement Science and Technology", year="2024", volume="35", number="12", pages="125026--125037", doi="10.1088/1361-6501/ad7a13", issn="1361-6501", url="https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13" }