Detail publikace

Characterization of Electron Emission from Broad Area Composite Emitter

AL SOUD, A. MOUSA, M. ALJABARAT, A. ABUAMR, A. TELFAH, A. KNÁPEK, A. ARRASHEED, E. SOBOLA, D.

Originální název

Characterization of Electron Emission from Broad Area Composite Emitter

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This work studies the emission of electrons from Copper Broad Area Emitter (CBAE) in addition to Copper Broad Area Composite Emitter (CBACE) and provides an explanation of the switch-on phenomenon based on the formation of conductive channels and traps. The samples were examined using field electron microscopy (FEM) at high vacuum conditions (10(-6) mbar) and a voltage of 15 kV, with the emitter placed 5 mm away from the anode. Scanning electron microscopy (SEM) was used to characterise the epoxy layer after voltage application. The results based on current and voltage characteristics showed that a breakdown of the epoxy layer occurred due to the emission of current at 13 kV.

Klíčová slova

road-area emitters; Field electron emission

Autoři

AL SOUD, A.; MOUSA, M.; ALJABARAT, A.; ABUAMR, A.; TELFAH, A.; KNÁPEK, A.; ARRASHEED, E.; SOBOLA, D.

Vydáno

4. 9. 2024

Nakladatel

IEEE

Místo

NEW YORK

ISBN

979-8-3503-7976-1

Kniha

International Vacuum Nanoelectronics Conference

ISSN

2164-2370

Periodikum

International Vacuum Nanoelectronics Conference

Stát

Spojené státy americké

Strany od

1

Strany do

2

Strany počet

2

URL

https://ieeexplore.ieee.org/abstract/document/10652461

BibTex

@inproceedings{BUT197231,
  author="Ammar {AL Soud} and Marwan Suleiman {Mousa} and Aseel {Aljabarat} and Adel M. {Abuamr} and Ahmad {Telfah} and Alexandr {Knápek} and Enas A. {Arrasheed} and Dinara {Sobola}",
  title="Characterization of Electron Emission from Broad Area Composite Emitter",
  booktitle="International Vacuum Nanoelectronics Conference",
  year="2024",
  journal="International Vacuum Nanoelectronics Conference",
  pages="2",
  publisher="IEEE",
  address="NEW YORK",
  doi="10.1109/IVNC63480.2024.10652461",
  isbn="979-8-3503-7976-1",
  issn="2164-2370",
  url="https://ieeexplore.ieee.org/abstract/document/10652461"
}