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J.Boušek
Originální název
Testing of solar cells using fast transients.
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. The measurement and evaluation procedure is very simple and no expensive devices are needed, but there are two problems which must be always considered. Firstly the recombination time depends on the actual concentration of minority carriers and also trapping effects can superimpose to the minority carriers concentration decay. Other problem is influence of cell junction parameters, especially the depletion layer capacitance, which masks the recombination phenomena. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.
Klíčová slova
solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance
Autoři
Rok RIV
2005
Vydáno
14. 9. 2005
Nakladatel
Nakl. Novotný
Místo
Brno
ISBN
80-214-2990-9
Kniha
Electronic Devices and Systems 2005. Proceedings
Strany od
194
Strany do
199
Strany počet
6
BibTex
@inproceedings{BUT20895, author="Jaroslav {Boušek}", title="Testing of solar cells using fast transients.", booktitle="Electronic Devices and Systems 2005. Proceedings", year="2005", pages="6", publisher="Nakl. Novotný", address="Brno", isbn="80-214-2990-9" }