Detail publikace

Fast transients in testing of solar cells PN-junction.

J.Boušek

Originální název

Fast transients in testing of solar cells PN-junction.

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.

Klíčová slova

Solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance

Autoři

J.Boušek

Rok RIV

2005

Vydáno

10. 12. 2005

Nakladatel

Nakl. Novotný

Místo

Brno

ISBN

80-214-3042-7

Kniha

Socrates Workshop

Strany od

121

Strany do

126

Strany počet

6

BibTex

@inproceedings{BUT20915,
  author="Jaroslav {Boušek}",
  title="Fast transients in testing of solar cells PN-junction.",
  booktitle="Socrates Workshop",
  year="2005",
  pages="6",
  publisher="Nakl. Novotný",
  address="Brno",
  isbn="80-214-3042-7"
}