Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

článek ve sborníku ve WoS nebo Scopus

angličtina

Images obtained in Scanning near-field optical microscopy (SNOM) depend strongly on the experimental conditions. The theoretical model taking into account a complex structure of samples (multilayers) and a general tip geometry is introduced. This model can be applied to the different SNOM configurations and for various sampéle-electromagnetic coupling factors.

resolution, sample coating, local probe, scanning near field optical microscopy

BENEŠOVÁ, M., TOMÁNEK, P., LIŠKA, M.

2000

19. 10. 2000

Slovenská technická univerzita v Bratislave

Bratislava

80-227-1413-5

CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, sv.4

85 - 90

6