Detail publikace

FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

PEČENKA, T. KOTÁSEK, Z. SEKANINA, L.

Originální název

FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is presented for the evaluation of diagnostic methods and tools. The structure of benchmark circuits together with their diagnostic properties is described. The set consists of 31 circuits at various levels of complexity (2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits with different diagnostic properties are available for each level of circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100%). The benchmark circuits are available both at the register transfer level and the gate level. In addition to the benchmark set, a method is described that was used to develop benchmark circuits with required complexity and diagnostic properties.

Klíčová slova

benchmark, synthetic, RTL, testability

Autoři

PEČENKA, T.; KOTÁSEK, Z.; SEKANINA, L.

Rok RIV

2006

Vydáno

25. 4. 2006

Nakladatel

IEEE Computer Society

Místo

Praha

ISBN

1424401844

Kniha

Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop

Strany od

285

Strany do

289

Strany počet

5

BibTex

@inproceedings{BUT22205,
  author="Tomáš {Pečenka} and Zdeněk {Kotásek} and Lukáš {Sekanina}",
  title="FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties",
  booktitle="Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop",
  year="2006",
  pages="285--289",
  publisher="IEEE Computer Society",
  address="Praha",
  isbn="1424401844"
}