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RAŠKA, M. HOLCMAN, V.
Originální název
Microplasma Noise - Coefficients of Generation and Recombination
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns may exhibit as a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and pulse origin time points. The current impulse noise is dependent on voltage. When the reverse voltage on PN junction increases, frequency and width of impulses are also increasing. The microplasma bistable behaviour may be described with two-state stochastic process of generation-recombination type.
Klíčová slova
mikroplazma
Autoři
RAŠKA, M.; HOLCMAN, V.
Rok RIV
2007
Vydáno
1. 1. 2007
Nakladatel
Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno
Místo
Brno
ISBN
978-80-214-3409-7
Kniha
Student EEICT 2007
Edice
3
Číslo edice
1
Strany od
356
Strany do
360
Strany počet
4
BibTex
@inproceedings{BUT22993, author="Michal {Raška} and Vladimír {Holcman}", title="Microplasma Noise - Coefficients of Generation and Recombination", booktitle="Student EEICT 2007", year="2007", series="3", number="1", pages="356--360", publisher="Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno", address="Brno", isbn="978-80-214-3409-7" }