Detail publikace

Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement

HÉGR, O.

Originální název

Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In this work we described measurement method for determine one of recombination parameters. For determination of lifetime minority carrier we used very know microwave-detected photoconductance decay (MW-PCD). The layers of SiNx were sputtered by means of RF magnetron. The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by Solartec company (Czech republic).

Klíčová slova

solar cell, surface passivation, antireflection coating, silicon nitride

Autoři

HÉGR, O.

Rok RIV

2007

Vydáno

1. 1. 2007

ISBN

978-80-214-3410-3

Kniha

Student EEICT 2007, Volume 4

Strany od

313

Strany do

317

Strany počet

4

BibTex

@inproceedings{BUT22994,
  author="Ondřej {Hégr}",
  title="Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement",
  booktitle="Student EEICT 2007, Volume 4",
  year="2007",
  pages="313--317",
  isbn="978-80-214-3410-3"
}