Detail publikace

STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS

KUBÁSEK, R. KOLÁŘOVÁ, E.

Originální název

STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper shows an application of the Ito stochastic calculus to the problem of modelling inductor-resistor electrical circuits. The deterministic model of the circuit is replaced by a stochastic model by adding a noise term in the source. The analytic solution of the resulting stochastic differential equation is obtained using the Ito formula. Statistical estimates of the stochastic solutions are examined and confidence intervals are found for the trajectories of the solution. The programming language C#, a part of the new MS .NET platform, is used for numerical simulations. The results were verified in an experiment by measurements on inductor-resistor electrical circuits.

Klíčová slova

stochastic models, RL circuits in experiments, modelling inductor-resistor electrical circuits

Autoři

KUBÁSEK, R.; KOLÁŘOVÁ, E.

Rok RIV

2007

Vydáno

1. 7. 2007

Nakladatel

UTEE, FEKT VUT v Brně

Místo

Paris

ISBN

978-80-214-3476-9

Kniha

TIEF 2007

Strany od

1

Strany do

3

Strany počet

3

BibTex

@inproceedings{BUT23515,
  author="Radek {Kubásek} and Edita {Kolářová}",
  title="STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS",
  booktitle="TIEF 2007",
  year="2007",
  pages="1--3",
  publisher="UTEE, FEKT VUT v Brně",
  address="Paris",
  isbn="978-80-214-3476-9"
}