Detail publikace

C-V Characterization of Nonlinear Capacitors Using CBCM Method

SUTORÝ, T. KOLKA, Z.

Originální název

C-V Characterization of Nonlinear Capacitors Using CBCM Method

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with a modification of CBCM (Charge-Based Capacitance Measurements) for nonlinear capacitance characterization. The method is characterized by high resolution although it is based on equipment found in any average laboratory. CBCM was originally developed for linear interconnect measurements. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35μm CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was successfully used for MOSCAPs characterization in full operating voltage range.

Klíčová slova

Microelectronics, CBCM, testing

Autoři

SUTORÝ, T.; KOLKA, Z.

Rok RIV

2007

Vydáno

21. 6. 2007

Nakladatel

Technical University of Lodz

Místo

Lodž, Poland

ISBN

83-922632-9-4

Kniha

Proceedings of the 14th International Conference Mixed Design of Integrated Circuits and Systems 2007

Strany od

501

Strany do

505

Strany počet

5

BibTex

@inproceedings{BUT23667,
  author="Tomáš {Sutorý} and Zdeněk {Kolka}",
  title="C-V Characterization of Nonlinear Capacitors Using CBCM Method",
  booktitle="Proceedings of the 14th International Conference Mixed Design of Integrated Circuits and Systems 2007",
  year="2007",
  pages="5",
  publisher="Technical University of Lodz",
  address="Lodž, Poland",
  isbn="83-922632-9-4"
}