Detail publikace

Advanced tunable protective structure against electrostatic discharge

Petr Běťák, Kamil Nováček

Originální název

Advanced tunable protective structure against electrostatic discharge

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

New advanced SCR (silicon controlled rectifier) structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by TCAD systems. Then can be uniquely determined which features will be given by certain dimensions setting.For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.

Klíčová slova

ESD, SCR, electrostatic discharge, silicon controlled rectifier

Autoři

Petr Běťák, Kamil Nováček

Rok RIV

2007

Vydáno

1. 1. 2007

Strany od

238

Strany do

241

Strany počet

4

BibTex

@inproceedings{BUT23809,
  author="Petr {Běťák} and Kamil {Nováček}",
  title="Advanced tunable protective structure against electrostatic discharge",
  booktitle="ISSE 2007 30th International Spring Seminar on Electronics Technology 2007",
  year="2007",
  pages="4"
}