Detail publikace

Minority carriers lifetime in Si PV cells with sputtered passivation

Ondřej Hégr, Jaroslav Boušek

Originální název

Minority carriers lifetime in Si PV cells with sputtered passivation

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Thin layers of silicon nitride are routinely used as passivation layers for solar cells. For deposition of SiNx films the main advantage of magnetron sputtering technology is low process temperature. The amount of the crystal lattice deffect decrease when using this low-temperature process. For determination of recombination parameters we used microwave-detected photo-conductance decay (MW-PCD). The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by company Solartec (Czech republic).

Klíčová slova

passivation layers, silicon nitride, magnetron sputtering, MW-PCD, lifetime

Autoři

Ondřej Hégr, Jaroslav Boušek

Vydáno

1. 1. 2006

Nakladatel

nakl. Z. Novotný

ISBN

960-8025-99-8

Kniha

Socrates workshop 2006

Strany od

177

Strany do

182

Strany počet

6

BibTex

@inproceedings{BUT24711,
  author="Ondřej {Hégr} and Jaroslav {Boušek} and Jaroslav {Sobota} and Radim {Bařinka} and Aleš {Poruba}",
  title="Minority carriers lifetime in Si PV cells with sputtered passivation",
  booktitle="Socrates workshop 2006",
  year="2006",
  volume="2006",
  number="1",
  pages="6",
  publisher="nakl. Z. Novotný",
  isbn="960-8025-99-8"
}