Detail publikace

Passivation quality test by noise method

VANĚK, J. KAZELLE, J. CHOBOLA, Z. JURÁNKOVÁ, V.

Originální název

Passivation quality test by noise method

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Transport and noise characteristic of forward biased monocrystalline silicon solar cells made by different passivation method were measured in order to evaluate new technology:

Klíčová slova

noise characteristic

Autoři

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V.

Rok RIV

2006

Vydáno

14. 9. 2006

Nakladatel

Ing.Zdeněk Novotný,CSc.

Místo

Brno

ISBN

80-214-3246-2

Kniha

Electronic Devices and Systems

Strany od

175

Strany do

178

Strany počet

4

BibTex

@inproceedings{BUT25071,
  author="Jiří {Vaněk} and Jiří {Kazelle} and Zdeněk {Chobola} and Vlasta {Juránková}",
  title="Passivation quality test by noise method",
  booktitle="Electronic Devices and Systems",
  year="2006",
  pages="175--178",
  publisher="Ing.Zdeněk Novotný,CSc.",
  address="Brno",
  isbn="80-214-3246-2"
}