Detail publikace

Microplasma noise sources in solar cells

JANDOVÁ, K. VANĚK, J. DOLENSKÝ, J. CHOBOLA, Z.

Originální název

Microplasma noise sources in solar cells

Anglický název

Microplasma noise sources in solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

čeština

Originální abstrakt

Reverse biased voltage is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions.

Anglický abstrakt

Reverse biased voltage is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions.

Klíčová slova

solar cells, microplasma, noise

Klíčová slova v angličtině

solar cells, microplasma, noise

Autoři

JANDOVÁ, K.; VANĚK, J.; DOLENSKÝ, J.; CHOBOLA, Z.

Rok RIV

2008

Vydáno

31. 5. 2008

Místo

Brno

ISBN

978-80-214-3659-6

Kniha

9th ABA Brno 2008

Edice

1

Strany od

210

Strany do

213

Strany počet

3

BibTex

@inproceedings{BUT26713,
  author="Kristýna {Jandová} and Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola}",
  title="Microplasma noise sources in solar cells",
  booktitle="9th ABA Brno 2008",
  year="2008",
  series="1",
  pages="210--213",
  address="Brno",
  isbn="978-80-214-3659-6"
}