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JANDOVÁ, K. VANĚK, J. BAŘINKA, R.
Originální název
DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.
Klíčová slova
electroluminescence, photoluminescence, solar cell, crystalline silicon, CCD camera, defect analysis, LBIC method
Autoři
JANDOVÁ, K.; VANĚK, J.; BAŘINKA, R.
Rok RIV
2008
Vydáno
1. 11. 2008
ISBN
3-936338-24-8
Kniha
23rd European Photovoltaic Solar Energy Conference, 1-5 September 2008, Valencia, Spain
Číslo edice
1
Strany od
458
Strany do
460
Strany počet
3
BibTex
@inproceedings{BUT27451, author="Kristýna {Jandová} and Jiří {Vaněk} and Radim {Bařinka}", title="DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL", booktitle="23rd European Photovoltaic Solar Energy Conference, 1-5 September 2008, Valencia, Spain", year="2008", number="1", pages="458--460", isbn="3-936338-24-8" }