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Detail publikace
TRIVEDI, R. ČECH, V.
Originální název
Analysis of surface morphology of plasma polymer films using atomic force microscopy
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
For thin polymer films, the surface roughness is one of the very important properties, which affects many other properties such as wettability, adhesion, friction etc. The present work describes the analysis of surface roughness of plasma polymer films of vinyltriethoxysilane and tetravinylsilane by atomic force microscopy. The films of different thickness were prepared at constant deposition conditions and the surface roughness was greatly influenced by the film thickness variation in case of vinyltriethoxysilane. An influence of RF power, used for film deposition of tetravinylsilane, on the surface roughness was observed for films of the same thickness.
Klíčová slova
Plasma polymerization, surface morphology, atomic force microscopy
Autoři
TRIVEDI, R.; ČECH, V.
Rok RIV
2007
Vydáno
13. 12. 2007
Strany od
121
Strany do
124
Strany počet
4
BibTex
@inproceedings{BUT28340, author="Rutul Rajendra {Trivedi} and Vladimír {Čech}", title="Analysis of surface morphology of plasma polymer films using atomic force microscopy", booktitle="Juniormat 07", year="2007", pages="121--124" }