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SALYK, O., KUŘITKA, I., WEITER, M., SCHAUER, F.
Originální název
Oriented Thin Films of Polysilylenes and their Properties
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.
Klíčová slova v angličtině
polysilane, luminescence, absorption, infrared spectra
Autoři
Rok RIV
2001
Vydáno
1. 1. 2001
Nakladatel
Brno University of Technology, Faculty of Chemistry
Místo
Brno
ISBN
80-214-1893-1
Kniha
Proceedings of the Workshop Electronic Properties of Molecular Materials and Functional Polymers of EU programme COST 518 Molecular Materials and Functional Polymers for Advanced Devices
Strany od
168
Strany do
176
Strany počet
9
URL
x
BibTex
@inproceedings{BUT2876, author="Ota {Salyk} and Ivo {Kuřitka} and Martin {Weiter} and František {Schauer}", title="Oriented Thin Films of Polysilylenes and their Properties", booktitle="Proceedings of the Workshop Electronic Properties of Molecular Materials and Functional Polymers of EU programme COST 518 Molecular Materials and Functional Polymers for Advanced Devices", year="2001", pages="9", publisher="Brno University of Technology, Faculty of Chemistry", address="Brno", isbn="80-214-1893-1", url="x" }