Detail publikace

Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis

STRNADEL, J.

Originální název

Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper presents a toolset utilizable for learning and training principles related to design-for-testability of digital systems by means of structural and ad-hoc techniques. Actually, the toolset consists of two tools named SET and CADeT. Using the tools, user is allowed to make experiments in the optimization area which goal is to achieve feasible cost/quality trade-off among design-constraints and diagnostic requirements posed on a digital system. In the paper, basic education-related characteristics of the tools are briefly presented.

Klíčová slova

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Autoři

STRNADEL, J.

Rok RIV

2007

Vydáno

20. 9. 2007

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-3470-7

Kniha

Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference

Strany od

333

Strany do

338

Strany počet

6

URL

https://www.fit.vut.cz/research/publication/8401/

BibTex

@inproceedings{BUT28819,
  author="Josef {Strnadel}",
  title="Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis",
  booktitle="Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference",
  year="2007",
  pages="333--338",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-3470-7",
  url="https://www.fit.vut.cz/research/publication/8401/"
}

Dokumenty

2007-eds.pdf