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TOMÁNEK, P. GRMELA, L.
Originální název
Optics of nanoobjects
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Conventional optics is diffraction limited to about half of the effective optical wavelength. However the current trend towards miniaturization of optical elements and devices requires methods of observation with high spatial resolutions adapted to the micrometer and submicrometer optical regime. More specifically, the use of Scanning near-field optical microscope (SNOM or NSOM) in various domains is overviewed. Basically an optical tip with a subwavelength aperture at its apex scans over a surface with a spatial resolution, which is not limited by light diffraction. This characteristic makes SNOM a valuable tool to perform various optical or spectroscopic studies on nanoobjects, such as semiconductor quantum dots (QDs), or to address them optically. The paper reviews different methods of far-field and near-field approach to visualize nano-size objects.
Klíčová slova
nanoobject, visualization, far-field, near-field, scanning near field optical microscopy, contrast, detection, localization, resolution, measurement
Autoři
TOMÁNEK, P.; GRMELA, L.
Rok RIV
2008
Vydáno
22. 4. 2008
Nakladatel
SPIE
Místo
Bellinhgham, USA
ISBN
978-0-8194-7218-2
Kniha
Proceedings SPIE -Eighth International Conference on Correlation Optics
Edice
7008
Číslo edice
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
Číslo
Stát
Spojené státy americké
Strany od
70081F01
Strany do
70081F11
Strany počet
11