Detail publikace

Optics of nanoobjects

TOMÁNEK, P. GRMELA, L.

Originální název

Optics of nanoobjects

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Conventional optics is diffraction limited to about half of the effective optical wavelength. However the current trend towards miniaturization of optical elements and devices requires methods of observation with high spatial resolutions adapted to the micrometer and submicrometer optical regime. More specifically, the use of Scanning near-field optical microscope (SNOM or NSOM) in various domains is overviewed. Basically an optical tip with a subwavelength aperture at its apex scans over a surface with a spatial resolution, which is not limited by light diffraction. This characteristic makes SNOM a valuable tool to perform various optical or spectroscopic studies on nanoobjects, such as semiconductor quantum dots (QDs), or to address them optically. The paper reviews different methods of far-field and near-field approach to visualize nano-size objects.

Klíčová slova

nanoobject, visualization, far-field, near-field, scanning near field optical microscopy, contrast, detection, localization, resolution, measurement

Autoři

TOMÁNEK, P.; GRMELA, L.

Rok RIV

2008

Vydáno

22. 4. 2008

Nakladatel

SPIE

Místo

Bellinhgham, USA

ISBN

978-0-8194-7218-2

Kniha

Proceedings SPIE -Eighth International Conference on Correlation Optics

Edice

7008

Číslo edice

7008

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

7008

Číslo

7008

Stát

Spojené státy americké

Strany od

70081F01

Strany do

70081F11

Strany počet

11