Detail publikace

Modeling of Current Density in Thick Film Resistors

PULEC, J. SZENDIUCH, I.

Originální název

Modeling of Current Density in Thick Film Resistors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper describes various methods for setting of desirable value of resistance in thick film resistors. In this ways adjusted resistors are next created and analyzed in view of maximum current density in them. Methods are compared and it is selected the optimal from them.

Klíčová slova

thick film technology, current density, relibility, simulation

Autoři

PULEC, J.; SZENDIUCH, I.

Rok RIV

2010

Vydáno

29. 4. 2010

Nakladatel

NOVPRESS

Místo

Brno

ISBN

978-80-214-4079-1

Kniha

STUDENT EEICT 2010

Číslo edice

1

Strany od

236

Strany do

240

Strany počet

5

BibTex

@inproceedings{BUT29968,
  author="Jiří {Pulec} and Ivan {Szendiuch}",
  title="Modeling of Current Density in Thick Film Resistors",
  booktitle="STUDENT EEICT 2010",
  year="2010",
  number="1",
  pages="236--240",
  publisher="NOVPRESS",
  address="Brno",
  isbn="978-80-214-4079-1"
}