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ZEBULUM, R., STOICA, A., KEYMEULEN, D., SEKANINA, L.
Originální název
Evolvable Hardware System at Extreme Low Temperatures
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper describes circuit evolutionary experiments at extreme low temperatures, including the test of all system components at this extreme environment (EE). In addition to hardening-by-process and hardening by-design, "hardening-by-reconfiguration", when applicable, could be used tomitigate drifts, degradation, or damage on electronic devices (chips) in EE, by using re-configurable devices and an adaptive selfreconfiguration of their circuit topology. Conventional circuit design exploits device characteristics within a certain temperature/radiation range; when that is exceeded, the circuit function degrades. On a reconfigurable device, although component parameters change in EE, a new circuit design, suitable for new parameter values, may be mapped into the reconfigurable structure to recover the initial circuit function. This paper demonstrates this technique for circuit evolution and recovery at liquid nitrogen temperatures (-196.6 °C). In addition, preliminary tests are performed to assess the survivability limitations of the evolutionary processor at extreme low temperatures.
Klíčová slova
evolvable hardware, extreme low temperatures, functional recovery
Autoři
Rok RIV
2005
Vydáno
19. 9. 2005
Nakladatel
Springer Verlag
Místo
Berlin
ISBN
978-3-540-28736-0
Kniha
Evolvable Systems: From Biology to Hardware
Edice
LNCS 3637
Strany od
37
Strany do
45
Strany počet
9
URL
http://www.fit.vutbr.cz/~sekanina/publ/ices05/lowtemp.pdf
BibTex
@inproceedings{BUT33688, author="Ricardo {Zebulum} and Adrian {Stoica} and Didier {Keymeulen} and Lukáš {Sekanina}", title="Evolvable Hardware System at Extreme Low Temperatures", booktitle="Evolvable Systems: From Biology to Hardware", year="2005", series="LNCS 3637", pages="37--45", publisher="Springer Verlag", address="Berlin", isbn="978-3-540-28736-0", url="http://www.fit.vutbr.cz/~sekanina/publ/ices05/lowtemp.pdf" }