Detail publikace

Exploitation of Scattered Context Grammars to Model VLIW Instruction Constraints

KŘOUSTEK, J. ŽIDEK, S. KOLÁŘ, D. MEDUNA, A.

Originální název

Exploitation of Scattered Context Grammars to Model VLIW Instruction Constraints

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

More and more nowadays data processing System-on-Chip (SoC) devices exploit the very long instruction word (VLIW) technology. The high performance of VLIW processors is achieved by a high instruction level parallelism. Program execution is scheduled statically at compilation time. Therefore, there is no need for run-time control mechanisms and hardware can be relatively simple. On the other hand, all constraints checks must be done by the compiler. This paper describes formal method for modeling instruction level limitations of these processors. This method is based on scattered context grammars that generate proper assembler code. This concept has two advantages - formal description of the dependency checking process and high reduction of description complexity over other methods.

Klíčová slova

scattered context grammar, SCG, VLIW, assembler, conflicts, latency

Autoři

KŘOUSTEK, J.; ŽIDEK, S.; KOLÁŘ, D.; MEDUNA, A.

Rok RIV

2010

Vydáno

11. 6. 2010

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Tallinn

ISBN

978-1-4244-7357-1

Kniha

Proceedings of the 12th Biennial Baltic Electronics Conference

Strany od

165

Strany do

168

Strany počet

4

URL

https://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5630284

BibTex

@inproceedings{BUT34822,
  author="Jakub {Křoustek} and Stanislav {Židek} and Dušan {Kolář} and Alexandr {Meduna}",
  title="Exploitation of Scattered Context Grammars to Model VLIW Instruction Constraints",
  booktitle="Proceedings of the 12th Biennial Baltic Electronics Conference",
  year="2010",
  pages="165--168",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Tallinn",
  doi="10.1109/BEC.2010.5630284",
  isbn="978-1-4244-7357-1",
  url="https://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5630284"
}