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Detail publikace
G. Tromba, R. Longo, A. Abrami, F. Arfelli, A. Astolfo, P. Bregant, F. Brun, K. Casarin, V.Chenda, D. Dreossi, M. Hola, J. Kaiser, L. Mancini, R.H. Menk, E. Quai, E. Quaia, L. Rigon, T. Rokvic, N. Sodini, D. Sanabor, E. Schultke, M. Tonutti, A. Vascotto, F. Zanconati, M. Cova, E. Castelli
Originální název
The SYRMEP Beamline of Elettra: Clinical Mammography and Bio-medical Applications
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
At the SYnchrotron Radiation for MEdical Physics (SYRMEP) beamline of Elettra Synchrotron Light Laboratory in Trieste (Italy), an extensive research program in bio-medical imaging has been developed since 1997. The core program carried out by the SYRMEP collaboration concerns the use of Synchrotron Radiation (SR) for clinical mammography with the aim of improving the diagnostic performance of the conventional technique. The first protocol with patients, started in 2006 has been completed at the end of 2009 and the data analysis is now in progress. Regarding applications different from clinical imaging, synchrotron X-ray computed microtomography (micro-CT) is the most used technique, both in absorption and phase contrast. A new software tool, Pore3D, has been developed to perform a quantitative morphological analysis on the reconstructed slices and to access textural information of the sample under study.
Klíčová slova
mammography, phase contrast, microtomography, quantitative analysis
Autoři
Rok RIV
2010
Vydáno
1. 7. 2010
Nakladatel
Springer
ISBN
978-0-7354-0813-5
Kniha
AIP Conference Proceedings
Edice
1
Strany od
18
Strany do
23
Strany počet
6
URL
http://www.springer.com/physics/applied+%26+technical+physics/book/978-0-7354-0813-5
BibTex
@inproceedings{BUT35643, author="Jozef {Kaiser} and Markéta {Holá}", title="The SYRMEP Beamline of Elettra: Clinical Mammography and Bio-medical Applications", booktitle="AIP Conference Proceedings", year="2010", series="1", pages="18--23", publisher="Springer", isbn="978-0-7354-0813-5", url="http://www.springer.com/physics/applied+%26+technical+physics/book/978-0-7354-0813-5" }