Detail publikace

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

KNÁPEK, A. GRMELA, L.

Originální název

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

Anglický název

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

čeština

Originální abstrakt

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

Anglický abstrakt

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

Klíčová slova

Schottky emission, cold emission electron source, noise diagnostics

Klíčová slova v angličtině

Schottky emission, cold emission electron source, noise diagnostics

Autoři

KNÁPEK, A.; GRMELA, L.

Rok RIV

2010

Vydáno

1. 9. 2010

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-4138-5

Kniha

IMAPS CS International Conference 2010 - Proceedings

Strany od

156

Strany do

160

Strany počet

5

BibTex

@inproceedings{BUT35688,
  author="Alexandr {Knápek} and Lubomír {Grmela}",
  title="Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer",
  booktitle="IMAPS CS International Conference 2010 - Proceedings",
  year="2010",
  pages="156--160",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-4138-5"
}