Detail publikace

A Voltage Event Recorder for More Accurate Analysis of Voltage Events in Power Supply Systems

BOK, J. DRÁPELA, J.

Originální název

A Voltage Event Recorder for More Accurate Analysis of Voltage Events in Power Supply Systems

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with the problems about correct recording and analyzing of voltage events occurred in power supply systems. Based on the results of many of performed simulations which compare the abilities of several known voltage events detection methods to correct analysis of occurred voltage events the paper proposes the usage of Extended Kalman Filter (EKF) as the preferred method to voltage event detection and monitoring. Except the main advantage of EKF method, which is the possibility of voltage event monitoring in real-time, this method has a lot of other specifics which can be used for better descriptions of detected voltage events. The paper presents a voltage event analyzer based on the EKF algorithm which is able to detect shape of voltage events more precisely than actual used RMS algorithms and on the basis of shape it can determine voltage event parameters more accurately. The analyzer is based on virtual instrumentation in LabVIEW using a data acquisition card from National Instrument.

Klíčová slova

voltage events, extended Kalman filter, rms method, voltage event recorder

Autoři

BOK, J.; DRÁPELA, J.

Rok RIV

2011

Vydáno

19. 6. 2011

Nakladatel

IEEE PES

Místo

345 E 47TH ST, NEW YORK, NY 10017 USA

ISBN

978-1-4244-8419-5

Kniha

Proceedings of the IEEE PES Trondheim PowerTech 2011

Edice

1

Číslo edice

1

Strany od

1

Strany do

7

Strany počet

7

BibTex

@inproceedings{BUT36585,
  author="Jaromír {Bok} and Jiří {Drápela}",
  title="A Voltage Event Recorder for More Accurate Analysis of Voltage Events in Power Supply Systems",
  booktitle="Proceedings of the IEEE PES Trondheim PowerTech 2011",
  year="2011",
  series="1",
  number="1",
  pages="1--7",
  publisher="IEEE PES",
  address="345 E 47TH ST, NEW YORK, NY 10017 USA",
  doi="10.1109/PTC.2011.6019364",
  isbn="978-1-4244-8419-5"
}