Detail publikace

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P.

Originální název

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

An application of noise and non-linearity measurements in analysis, diagnostics and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typical feature of these methods. The principles of noise and non-linearity measuring set-up are shown. Conceptions of 1/f noise, burst or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.

Klíčová slova

Noise, non-linearity, reliability indicators.

Autoři

ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P.

Rok RIV

2004

Vydáno

1. 1. 2004

ISSN

0352-9045

Periodikum

Informacije MIDEM

Ročník

2003

Číslo

4

Stát

Slovinská republika

Strany od

213

Strany do

221

Strany počet

9

BibTex

@article{BUT42097,
  author="Josef {Šikula} and Vlasta {Sedláková} and Pavel {Dobis}",
  title="Noise and Non-Linearity as Reliability Indicators of Electronic Devices",
  journal="Informacije MIDEM",
  year="2004",
  volume="2003",
  number="4",
  pages="213--221",
  issn="0352-9045"
}