Detail publikace

Analysis of Roughness-Induced Crack-Tip Shielding in Terms of Size Ratio Effect

POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.

Originální název

Analysis of Roughness-Induced Crack-Tip Shielding in Terms of Size Ratio Effect

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

A new theoretical concept is introduced to describe the roughness-induced shielding effects in metallic materials. It is based on the statistics of the local ratio between the characteristic microstructure distance and the plastic zone size. Both the crack branching and the crack closure phenomena are generally described in the frame of linear elastic fracture mechanics under the assumption of the remote Mode I loading. Using this approach, intrinsic values of fracture toughness and fatigue crack growth threshold can be determined, and the roughness-induced component can be separated from other closure components, such as plasticity or oxide induced closure. In order to estimate the total RIS effect, standard material data as the yield stress, the mean grain size, the surface roughness, and the fracture mode are only necessary. Application examples concerning static fracture and fatigue are presented for UHSLA steels, ARMCO iron, aluminum, and titanium alloys.

Klíčová slova

roughness-induced shielding, crack branching, crack closure, size ratio, statistical approach

Autoři

POKLUDA, J.; ŠANDERA, P.; HORNÍKOVÁ, J.

Rok RIV

2005

Vydáno

1. 1. 2005

ISSN

1546-962X

Periodikum

Journal of ASTM International

Ročník

2

Číslo

4

Stát

Spojené státy americké

Strany od

1

Strany do

15

Strany počet

15

URL

http://www.astm.org/DIGITAL_LIBRARY/JOURNALS/JAI/PAGES/JAI11997.htm

BibTex

@article{BUT42830,
  author="Jaroslav {Pokluda} and Pavel {Šandera} and Jana {Horníková}",
  title="Analysis of Roughness-Induced Crack-Tip Shielding in Terms of Size Ratio Effect",
  journal="Journal of ASTM International",
  year="2005",
  volume="2",
  number="4",
  pages="1--15",
  issn="1546-962X",
  url="http://www.astm.org/DIGITAL_LIBRARY/JOURNALS/JAI/PAGES/JAI11997.htm"
}