Detail publikace

Noise spectroscopy of shallow traps in CdTe crystals

SCHAUER, P.

Originální název

Noise spectroscopy of shallow traps in CdTe crystals

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors.

Klíčová slova

noise, traps, spectroscopy, CdTE

Autoři

SCHAUER, P.

Rok RIV

2010

Vydáno

9. 11. 2010

Nakladatel

ZČU

Místo

Plzeň, Czech Republic

ISSN

1802-4564

Periodikum

ElectroScope - http://www.electroscope.zcu.cz

Ročník

2010

Číslo

3

Stát

Česká republika

Strany od

55

Strany do

59

Strany počet

5

BibTex

@article{BUT50551,
  author="Pavel {Schauer}",
  title="Noise spectroscopy of shallow traps in CdTe crystals",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2010",
  volume="2010",
  number="3",
  pages="55--59",
  issn="1802-4564"
}