Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J.
Originální název
Noise spectroscopy of thick film
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regions, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral density was used to estimate the quality and reliability of these devices.
Klíčová slova v angličtině
hot carrier, gap, degradation reliability
Autoři
Rok RIV
2002
Vydáno
1. 7. 2002
Nakladatel
Ing.Zdeněk Novotný, CSc.
Místo
Brno
ISBN
80-2389094-8
Kniha
Noise and Non-linearity Testing of Modern Electronic Componets
Strany od
71
Strany do
72
Strany počet
2
BibTex
@inproceedings{BUT5700, author="Lubomír {Grmela} and Pavel {Tománek} and Pavel {Koktavý} and Jan {Pavelka} and Josef {Šikula}", title="Noise spectroscopy of thick film", booktitle="Noise and Non-linearity Testing of Modern Electronic Componets", year="2002", pages="2", publisher="Ing.Zdeněk Novotný, CSc.", address="Brno", isbn="80-2389094-8" }