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TOMÁNEK, P., GRMELA, L.
Originální název
Near field photocurrent spectroscopy of crystalline GaAs solar cells
Typ
abstrakt
Jazyk
angličtina
Originální abstrakt
Visible light Scanning Near-field Optical Microscopy (SNOM) is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation and allows a spectroscopic measurements. In this work, we measured the SNOM-induced photocurrent in GaAs devices. Our goal was to obtain spatially resolved measurements of the photocurrent response across the various layers in crystalline GaAs solar cells, by studying the cleaved edges of the cells.
Klíčová slova
Near-field spectroscopy, GaAs, solar cells
Autoři
Vydáno
13. 10. 2004
Nakladatel
Vydavatelstvo STU Bratislava
Místo
Trnava
ISBN
80-227-2121-5
Kniha
CO-MAt-TECH 2004. Proceedings of the Abstracts
Strany od
207
Strany do
Strany počet
1
BibTex
@misc{BUT59980, author="Pavel {Tománek} and Lubomír {Grmela}", title="Near field photocurrent spectroscopy of crystalline GaAs solar cells", booktitle="CO-MAt-TECH 2004. Proceedings of the Abstracts", year="2004", pages="1", publisher="Vydavatelstvo STU Bratislava", address="Trnava", isbn="80-227-2121-5", note="abstract" }