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Petr Běťák
Originální název
Advanced tunable protective structure against electrostatic discharge
Typ
abstrakt
Jazyk
angličtina
Originální abstrakt
New advanced SCR structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by computer aided design systems (TCAD). Then can be uniquely determined which features will be given by certain dimensions setting. For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.
Klíčová slova
ESD, SCR, electrostatic discharge, silicon controlled rectifier
Autoři
Vydáno
1. 1. 2007
ISBN
978-973-713-174-4
Kniha
ISSE 2007 30th International Spring Seminar on Electronics Technology 2007
Strany od
238
Strany do
239
Strany počet
2
BibTex
@misc{BUT60524, author="Petr {Běťák}", title="Advanced tunable protective structure against electrostatic discharge", booktitle="ISSE 2007 30th International Spring Seminar on Electronics Technology 2007", year="2007", pages="2", isbn="978-973-713-174-4", note="abstract" }