Noncontact Scanning Force Microscopy - Principles and Simulations

článek ve sborníku ve WoS nebo Scopus

angličtina

In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.

noncontact SFM, nanostructures, interatomic forces

KALOUSEK, R., ŠIKOLA, T., BUŠ, V., ŠKODA, D.

2002

15. 11. 2001

FEI VUT v Brně

Brno

80-214-1992-X

Sborník příspěvků konference Nové trendy ve fyzice

369

374

6