Detail publikace

Near field photoluminescence and photoreflectance measurements of semiconductor structures

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P.

Originální název

Near field photoluminescence and photoreflectance measurements of semiconductor structures

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

We present near-field local photoluminescence, local current and photoreflectance spectroscopic study of semiconductor quantum structures using a technique of reflection scanning near-field optical microscopy (SNOM) in combination with Nitrogen (or Ti:Saphire) laser and dye laser in one arm and He-Ne lasers in the other one.

Klíčová slova

near field optics, photoreflectance, photoluminescence, lateral resolution

Autoři

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P.

Rok RIV

2001

Vydáno

3. 10. 2001

Nakladatel

MSSI

Místo

Limerick

Strany od

59

Strany do

59

Strany počet

1

BibTex

@inproceedings{BUT6613,
  author="Pavel {Tománek} and Markéta {Benešová} and Pavel {Dobis} and Lubomír {Grmela} and Jitka {Brüstlová} and Dana {Otevřelová} and Petr {Létal}",
  title="Near field photoluminescence and photoreflectance measurements of semiconductor structures",
  booktitle="Nanomaterials: Fundamentals and applications",
  year="2001",
  pages="1",
  publisher="MSSI",
  address="Limerick"
}